1.

国際会議録
国際会議録
1. Optical characterization methods of InP-based micro-opto-electro-mechanical systems
Dantec,R.Le ; Benyattou,T. ; Guillot,G. ; Seassal,C. ; Leclercq,J.-L. ; Letartre,X. ; Gagnaire,A. ; Gendry,M. ; Viktorovitch,P. ; Benferhat,R. ; Rondi,D. ; Blondeau,R.R.
出版情報: Miniaturized systems with micro-optics and micromechanics II : 10-12 February 1997, San Jose, California.  pp.258-264,  1997.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3008
2.

国際会議録
国際会議録
2. InP-based micromechanical tunable and selective photodetector for WDM systems
Seassal,C. ; Leclercq,J.-L. ; Letartre,X. ; Gagnaire,A. ; Gendry,M. ; Viktorovitch,P. ; Laine,J.P. ; Sidoroff,F. ; Dantec,R.Le ; Miu,C. ; Benyattou,T. ; Guillot,G. ; Rondi,D. ; Blondeau,R.R.
出版情報: Miniaturized systems with micro-optics and micromechanics II : 10-12 February 1997, San Jose, California.  pp.62-67,  1997.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3008
3.

国際会議録
国際会議録
3. Evidence for an Assisted Defect Mechanism Leading to a Reduced Apparent Band Offset
Stievenard,D. ; Letartre,X. ; Lannoo,M. ; Abou,S. ; Guillot,G.
出版情報: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.1  pp.587-592,  1994.  Zurich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 143-147