1.

国際会議録
国際会議録
1. A Review of Electron Spin Resonance Spectroscopy of Defects in Thin Film SiO2 on Silicon
Conley, J. ; Lenahan, P.
出版情報: The physics and chemistry of SiO[2] and the Si-SiO[2] interface-3, 1996 : proceedings of the Third International Symposium on the Physics and Chemistry of SiO[2] and the Si-SiO[2] Interface.  pp.214-249,  1996.  Pennington, NJ.  Electrochemical Society
シリーズ名: Electrochemical Society Proceedings Series
シリーズ巻号: 96-1
2.

国際会議録
国際会議録
2. Effect of nitrogen ambients during high temperature SIMOX annealing
Roitman, P. ; Mayo, S. ; Simons, D. ; Krause, S.J. ; Venables, D. ; Park, J.C. ; Lee, J.D. ; Lenahan, P. ; Conley, J.
出版情報: Proceedings of the Sixth International Symposium on Silicon-on-Insulator Technology and Devices.  pp.92-97,  1994.  Pennington, NJ.  Electrochemical Society
シリーズ名: Electrochemical Society Proceedings Series
シリーズ巻号: 1994-11