Surface scattering and diffraction for advanced metrology II : 9 July 2002 Seattle, Washington, USA. pp.7-14, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Pahk, S. ; Joo, S.-S. ; Nam, H.-S. ; Lee, S.-W. ; Kim, H.-G.
出版情報:
Fiber optic components, subsystems, and systems for telecommunications : 7-9 November 2001, Nanjing, China. pp.201-210, 2001. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Oh, J.-T. ; Kim, B.-M. ; Son, S.-R. ; Lee, S.-W. ; Kim, D.-Y. ; Kim, Y.-S.
出版情報:
Coherence domain optical methods and optical coherence tomography in biomedicine VIII : 26-28 January 2004, San Jose, California, USA. pp.463-466, 2004. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
The physics and chemistry of SiO2 and the Si-SiO2 interface-4, 2000 : proceedings of the fourth International Symposium on the Physics and Chemistry of SiO2 and the Si-SiO2 Interface, Tronto, Canada, May 15-18, 2000. pp.199-208, 2000. Pennington, N.J.. Electrochemical Society
Lee, S.-W. ; Ishimaru, A. ; Kuga, Y. ; Jandhyala, V.
出版情報:
Complex mediums III : beyond linear isotropic dielectrics : 8-10 July 2002, Seattle, [Washington] USA. pp.92-99, 2002. Bellingham, Washington. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Microfluidics, bioMEMS, and medical microsystems III : 24-26 January 2005, San Jose, California, USA. pp.194-199, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Lee, S.-W. ; Park, C.J. ; Kang, T.W. ; Cho, H.Y. ; Hirakawa, K.
出版情報:
Semiconductor photodetectors II : 25-26 January 2005, San Jose, California, USA. pp.146-152, 2005. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Proceedings of the Symposium on Diagnostic Techniques for Semiconductor Materials and Devices. pp.283-294, 1994. Pennington, NJ. Electrochemical Society
Lee, E.-A. ; Lee, S.-W. ; Choi, C.-H. ; Kim, H.-S. ; Hockey, B.
出版情報:
Eco-materials processing & design : ISEPD-4, proceedings of the 4th International Symposium on Eco-Materials Processing & Design, Gyungpodae, Korea, February 4-6, 2003. pp.288-296, 2003. Zuerich, Switzerland. Trans Tech Publications
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