1.

国際会議録
国際会議録
1. Rearrangement effects in inner-shell photodetachment from Sn- negative ion
Ivanov,V.K. ; Kashenock,G.Yu. ; Lapkin,K.V.
出版情報: Fourth International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering.  pp.92-97,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4348
2.

国際会議録
国際会議録
2. Resonance photodetachment of Sn negative ion
Ivanov,V.K. ; Kashenock,G.Yu. ; Lapkin,K.V.
出版情報: Third International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering : 7-11 June 1999, St. Petersburg, Russia.  pp.97-104,  2000.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4064