1.

国際会議録
国際会議録
1. SUPERLATTICE OPTICAL PROPERTIES MEASURED BY VARIABLE ANGLE SPECTROSCOPIC ELLIPSOMETRY
Snyder, P. G. ; Merkel, K. G. ; De, B. N. ; Woollam, J. A. ; Langer, D. W. ; Stutz, C. E. ; Jones, R. ; Rai, A. K. ; Evans, K.
出版情報: Epitaxy of semiconductor layered structures : symposium held November 30-December 4, 1987, Boston, Massachusetts, U.S.A..  pp.165-168,  1988.  Pittsburgh, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 102
2.

国際会議録
国際会議録
2. Hall Scattering Factor and Electron Mobility of 4H SiC: Measurements and Numerical Simulation
Rutsch, G. ; Devaty, R. P. ; Choyke, W. J. ; Langer, D. W. ; Rowland, L. B. ; Niemann, E. ; Wischmeyer, F.
出版情報: Silicon carbide and related materials - 1999 : ICSCRM'99, proceedings of the International Conference on Silicon Carbide and Related Materials - 1999, Research Triangle Park, North Carolina, USA, October 10-15, 1999.  pp.733-736,  2000.  Zuerich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 338-342(1)