1.

国際会議録
国際会議録
1. Online defects localization on mirrorlike surfaces
Delcroix,G. ; Aluze,D. ; Merienne,F. ; Lamalle,B. ; Gorria,P.
出版情報: Machine vision applications in industrial inspection VII : 25-26 January 1999, San Jose, California.  pp.34-42,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3652
2.

国際会議録
国際会議録
2. Study and design of a programmable silicon retina for real-time pattern recognition
Lamalle,B. ; Gorria,P. ; Voon,L.F.C.L.Y. ; Cathebras,G.
出版情報: Optical diagnostics for industrial applications : 22-24 May 2000, Glasgow, Scotland, United Kingdom.  pp.225-234,  2000.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4076
3.

国際会議録
国際会議録
3. Silicon retina for real-time pattern recognition
Voon,L.F.C.L.Y. ; Cathebras,G. ; Bellach,B. ; Lamalle,B. ; Gorria,P.
出版情報: Sensors and camera systems for scientific, industrial, and digital photography applications II : 22-24 January 2001, San Jose, [California] USA.  pp.168-177,  2001.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4306
4.

国際会議録
国際会議録
4. Lighting study for an optimal defects detection by artificial vision
Coulot,C. ; Kohler-Hemmerlin,S. ; Dumont,C. ; Aluze,D. ; Lamalle,B.
出版情報: Machine Vision Applications in Industrial Inspection V.  pp.69-77,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3029