1.

国際会議録
国際会議録
1. NON-CONTACT, NO WAFER PREPARATION DEEP LEVEL, TRANSIENT SPECTROSCOPY (DLTS) BASED ON SURFACE PHOTOVOLTAGE (SPV)
Lagowski, Jacek ; Edelman,. Piotr ; Dexter, Mark
出版情報: Photo-induced space charge effects in semiconductors: electro-optics, photoconductivity, and the photorefractive effect : symposium held April 29-May 1, 1992, San Francisco, California, U.S.A..  pp.217-222,  1992.  Pittsburgh, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 261
2.

国際会議録
国際会議録
2. SURFACE CHARGE IMAGING IN SEMICONDUCTOR WAFERS BY SURFACE PHOTOVOLTAGE (SPV)_
Edelman,. Piotr ; Lagowski, Jacek ; Jastrzebski, Lubek
出版情報: Photo-induced space charge effects in semiconductors: electro-optics, photoconductivity, and the photorefractive effect : symposium held April 29-May 1, 1992, San Francisco, California, U.S.A..  pp.223-228,  1992.  Pittsburgh, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 261
3.

国際会議録
国際会議録
3. NON-CONTACT, WAFER-SCALE DEEP LEVEL TRANSIENT SPECTROS COPY (DLTS) BASED ON SURFACE PHOTOVOLTAGE (SPV)
Lagowski, Jacek ; Morawski, Adrzej ; Edelman, Piotr
出版情報: Advanced III-V compound semiconductor growth, processing and devices : symposium held Decmber[i.e. December] 2-5, 1991, Boston, Massachusetts, U.S.A..  pp.129-134,  1992.  Pittsburgh, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 240
4.

国際会議録
国際会議録
4. Non-Contact Mapping of Fe Contamination in Oxidized Si Wafers With Sensitivity in Part-Per-Trillion Range
Lagowski, Jacek ; Edelman, Piotr
出版情報: Materials reliability in microelectronics VI : symposium held April 8-12, 1996, San Francisco, California, U.S.A..  pp.449-,  1996.  Pittsburgh, Pa..  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 428
5.

国際会議録
国際会議録
5. POROUS SILICON LUMINESCENCE STUDY BY IMAGING METHODS: RELATIONSHIP TO PORE DIMENSIONS
Kontkiewicz, Anna ; Kontkiewicz, Andrzej M. ; Sen, Sidhartha ; Wesolowski, Marek ; Lagowski, Jacek ; Edelman, Piotr ; Kowalewski, Tomasz
出版情報: Determining nanoscale physical properties of materials by microscopy and spectroscopy.  pp.201-,  1994.  Pittsburgh, Pa..  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 332
6.

国際会議録
国際会議録
6. Ultrasound Defect Engineering of Transition Metals Via Metal-Acceptor Pairs in Silicon
Bell, Ronald E., II. ; Ostapenko, Serguei ; Lagowski, Jacek
出版情報: Defect and impurity engineered semiconductors and devices : symposium held April 17-21, 1995, San Francisco, California, U.S.A..  pp.647-,  1995.  Pittsburgh, PA.  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 378
7.

国際会議録
国際会議録
7. CONTAMINATION MONITORING USING SURFACE PHOTOVOLTAGE AND APPLICATION TO PROCESS LINE CONTROL
Jastrzebski, Lubek ; Lagowski, Jacek ; Henley, Worth ; Edelman, Piotr
出版情報: Beam-solid interactions for materials synthesis and characterization : symposium held November 28-December 2, 1994, Boston, Massachusetts, U.S.A..  pp.405-,  1995.  Pittsburgh, Pa..  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 354