2008 International Conference on Optical Instruments and Technology: Advanced Sensor Technologies and Applications. pp.715712-1-715712-7, 2008. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
M. Pantouvaki ; L. Zhao ; C. Huffman ; K. Vanstreels ; I. Ciofi ; G. Vereecke ; T. Conard ; Y. Ono ; M. Nakajima ; K. Nakatani ; G. P. Beyer ; M. R. Baklanov
出版情報:
Materials, processes, and reliability for advanced interconnects for micro- and nanoelectronics--2011 : symposium held April 25-29, 2011, San Francisco, California, U.S.A.. 1335 pp.3-14, 2012. Warrendale, PA. Materials Research Society
Optical test and measurement technology and equipment. 3 pp.67235T-1-67235T-5, 2007. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Optical test and measurement technology and equipment. 3 pp.67235P-1-67235P-5, 2007. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Optical test and measurement technology and equipment. 3 pp.67235U-1-67235U-4, 2007. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
International Symposium on Photoelectronic Detection and Imaging 2007. pp.66210Z-1-66210Z-12, 2008. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering