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Geoinformatics 2006 : Geospatial information science : 28-29 October 2006, Wuhan, China. pp.64201Q-1-64201Q-13, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
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27th International Congress on High-Speed Photography and Photonics : 17-22 September 2006, Alexandria, Xian, China. pp.62792I-1-62792I-8, 2007. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
J. Qu ; B. Guo ; J. Li ; Q. Yang ; J. Liu ; L. Niu ; H. Niu
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27th International Congress on High-Speed Photography and Photonics : 17-22 September 2006, Alexandria, Xian, China. pp.627907-1-627907-12, 2007. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
J. Liu ; F. Zhang ; L. Li ; L. Niu ; W. Peng ; J. Shi ; Q. Yang ; H. Niu
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27th International Congress on High-Speed Photography and Photonics : 17-22 September 2006, Alexandria, Xian, China. pp.62790G-1-62790G-5, 2007. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Optoelectronic materials : Selected, peer reviewed papers from the 2010 International Conference on Optical, Electronic and Electrical Materials, August 1-4, Kunming, China, OEEM 2010. pp.995-998, 2010. Aedermannsdorf, Switzerland. Trans Tech Publications
Optoelectronic materials : Selected, peer reviewed papers from the 2010 International Conference on Optical, Electronic and Electrical Materials, August 1-4, Kunming, China, OEEM 2010. pp.141-145, 2010. Aedermannsdorf, Switzerland. Trans Tech Publications
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Proceedings of SPIE - the International Society for Optical Engineering
Optical components and materials V : 21-23 January 2008, San Jose, California, USA. pp.68900E-1-68900E-5, 2008. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering