1.

国際会議録
国際会議録
1. Reliability Issues of Ultra Thin Silicon Nitride (a-SiN:H) by Hot Wire CVD for Deep Sub-Micron CMOS Technologies
Waghmare, P.C. ; Patil, S.B. ; Kumbhar, A. ; Dusane, R.O. ; Rao, Ramgopal
出版情報: Proceedings of the Eleventh International Workshop on the Physics of Semiconductor Devices : (December 11-15, 2001).  VOL-2  pp.1418-1420,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4746
2.

国際会議録
国際会議録
2. Transmission electron microscopy study of gold-coated iron core-shell and Au/Fe/Au onion-like nanoparticles synthesized using reverse micelles
Zhou, W. L. ; Carpenter, E. E. ; Sims, J. ; Kumbhar, A. ; O'Connor, C. J.
出版情報: Nanophase and nanocomposite materials III : symposium held November 29-December 2, 1999, Boston, Massachusetts, U.S.A..  pp.107-,  2000.  Pittsburgh, Pa..  MRS-Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 581