1.

国際会議録
国際会議録
1. Modified high-accuracy 3D shape data conversion system for reverse engineering applications
Sitnik,R. ; Kujawinska,M.
出版情報: Optical measurement systems for industrial inspection II : application in production engineering : 20-21 June 2001 Munch, Germany.  pp.75-82,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4399
2.

国際会議録
国際会議録
2. Long-base optical extensometer for tensile testing machines
Salbut,L.A. ; Kujawinska,M. ; Sitnik,R. ; Dymny,G.
出版情報: Optical measurement systems for industrial inspection II : application in industrial design : 18-19 June 2001 Munch, Germany.  pp.45-49,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4398
3.

国際会議録
国際会議録
3. Novel laser grating interferometer (LES) for industrial applications
Kujawinska,M. ; Salbut,L.A.
出版情報: Optical measurement systems for industrial inspection II : application in industrial design : 18-19 June 2001 Munch, Germany.  pp.145-150,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4398
4.

国際会議録
国際会議録
4. Shape and displacement determination based on extended spatio-temporal fringe pattern analysis
Pawlowski,M.E. ; Kujawinska,M.
出版情報: Optical measurement systems for industrial inspection II : application in production engineering : 20-21 June 2001 Munch, Germany.  pp.50-56,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4399
5.

国際会議録
国際会議録
5. Modified electronic speckle pattern shearing interferometry for simultaneous derivative map measurements
Dymny,G. ; Kujawinska,M. ; Waldner,S.
出版情報: Optical inspection and micromeasurements II : 16-19 June 1997, Munich, FRG.  pp.204-210,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3098
6.

国際会議録
国際会議録
6. Errors in two-directional spatial-carrier phase-shifting method for closed fringe pattern analysis
Pirga,M. ; Kujawinska,M.
出版情報: Laser interferometry VIII--techniques and analysis : 6-7 August, 1996, Denver Colorado.  pp.72-83,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 2860
7.

国際会議録
国際会議録
7. Monitoring and measurement of movement of objects by fringe projection method
Pawtowski,M.E. ; Kujawinska,M. ; Wegiel,M.
出版情報: Three-dimensional image capture and applications III : 24-25 January 2000, San Jose, California.  pp.116-125,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3958
8.

国際会議録
国際会議録
8. Opto-numerical methods of data acquisition for computer graphics and animation systems
Sitnik,R. ; Kujawinska,M.
出版情報: Three-dimensional image capture and applications III : 24-25 January 2000, San Jose, California.  pp.36-43,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3958
9.

国際会議録
国際会議録
9. Selection of interferometric methods for silicon microelement testing
Gorski,W. ; Kujawinska,M. ; Satbut,L.A.
出版情報: Interferometry '99 : applications : 20-23 September 1999, Pułtusk, Poland.  pp.307-318,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3745
10.

国際会議録
国際会議録
10. Investigation of ceramic-to-metal joint properties by hybrid moire interferometry/FEM analysis
Satbut,L.A. ; Kujawinska,M. ; Jozwik,M. ; Golanski,D.
出版情報: Interferometry '99 : applications : 20-23 September 1999, Pułtusk, Poland.  pp.298-306,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3745