1.

国際会議録
国際会議録
1. Irradiation induced lattice defects in In0.53Ga0.47As PIN photodiodes
Kudou,T. ; Ohyama,H. ; Vanhellemont,J. ; Simoen,E. ; Claeys,C. ; Takami,Y. ; Fujii,A. ; Sunaga,H.
出版情報: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part2  pp.1217-1222,  1997.  Zurich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 258-263
2.

国際会議録
国際会議録
2. Spectroscopic detection of ammonia using diode-pumped difference-frequency generation
Ueda,T. ; Wada,M. ; Sugiyama,T. ; Nakajima,S. ; Umezawa,T. ; Araki,S. ; Kudou,T.
出版情報: Growth, Fabrication, Devices, and Applications of Laser and Nonlinear Materials.  pp.21-25,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4268