Kubis, M. ; Handstein, A. ; Gebel, B. ; Gutfleisch, O. ; Muller, K. -H. ; Schultz, L.
出版情報:
Metastable, mechanically alloyed and nanocrystalline materials : ISMANAM-99 : proceedings of the International Symposium on Metastable, Mechanically Alloyed and Nanocrystalline Materials (ISMANAM-99), held in Dresden, Germany, August 30-September 3, 1999. pp.557-561, 2000. Zuerich-Uetikon, Switzerland. Trans Tech Publications
Muller, K. -H. ; Kubis, M. ; Oleinek, Ph. ; David, G. ; Handstein, A. ; Gutfleisch, O. ; Schultz, L.
出版情報:
Metastable, mechanically alloyed and nanocrystalline materials : ISMANAM 98 : proceedings of the International Symposium on Metastable, Mechanical Alloyed and Nanocrystalline Materials (ISMANAM 98), held in Wollongong(Sydney), Australia, December 1998. pp.23-32, 1999. Zuerich, Switzerland. Trans Tech Publications
Gutfleisch, O. ; Bollero, A. ; Kubis, M. ; Muller, K. -H. ; Schultz, L.
出版情報:
Metastable, mechanically alloyed and nanocrystalline materials : ISMANAM-99 : proceedings of the International Symposium on Metastable, Mechanically Alloyed and Nanocrystalline Materials (ISMANAM-99), held in Dresden, Germany, August 30-September 3, 1999. pp.405-410, 2000. Zuerich-Uetikon, Switzerland. Trans Tech Publications
Gutfeisch, O. ; Kubis, M. ; Handstein, A. ; Muller, K-M. ; Schultz, L.
出版情報:
Advanced hard and soft magnetic materials : symposium held April 5-8, 1999, San Francisco, California, U.S.A.. pp.3-, 1999. Warrendale. MRS-Materials Research Society
Gebel, B. ; Kubis, M. ; Roessler, U.K. ; Mueller, K.-H.
出版情報:
European magnetic materials and applications : proceedings of the 8th European Magnetic Materials and Applications Conference, Kyiv, Ukraine, June 7-10, 2000. pp.317-320, 2001. Uetikon-Zuerich, Switzerland. Trans Tech Publications
Berger, C. ; Schiwon, R. ; Trepte, S. ; Friedrich, M. ; Kubis, M. ; Horst, J ; Grandpierre, A. G.
出版情報:
Metrology, Inspection, and Process Control for Microlithography XX. pp.61523T-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Grandpierre, A G. ; Berger, C. ; Schroeder, U. P. ; Schiwon, R. ; Kubis, M.
出版情報:
Metrology, Inspection, and Process Control for Microlithography XX. pp.61523V-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Schiwon, R. ; Grandpierre, A. G. ; Kubis, M. ; Schroder, U. P.
出版情報:
Metrology, Inspection, and Process Control for Microlithography XIX. pp.51-58, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
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