1.

国際会議録
国際会議録
1. European Facilities for the Study of Zeolite Formation on the International Space Station
Kirschhock, C. ; Kremer, S. ; Jacobs, P. ; Pletser, V. ; Minster, O. ; Kassel, R. ; Preud' homme, F. ; Martens, J.
出版情報: Recent advances in the science and technology of zeolites and related materials : proceedings of the 14th International Zeolite Conference, Cape Town, South Africa, 25-30th April 2004.  pp.139-146,  2004.  Amsterdam.  Elsevier
シリーズ名: Studies in surface science and catalysis
シリーズ巻号: 154
2.

国際会議録
国際会議録
2. 02-O-04 - Colloid chemical properties of silicalite-1 nanoslabs
Kremer, S. ; Kirschhock, C. ; Rouxhet, P. ; Jacobs, P.A. ; Martens, J.A.
出版情報: Zeolites and mesoporous materials at the dawn of the 21st century : proceedings of the 13th International Zeolite Conference, Montpellier, France, 8-13 July 2001.  pp.141-141,  2001.  Amsterdam.  Elsevier
シリーズ名: Studies in surface science and catalysis
シリーズ巻号: 135
3.

国際会議録
国際会議録
3. In-chip optical CD measurements for non-volatile memory devices [6152-13]
Vasconi, M. ; Kremer, S. ; Polli, M. ; Severgnini, E. ; Trovati, S. S.
出版情報: Metrology, Inspection, and Process Control for Microlithography XX.  pp.61520D-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 6152
4.

国際会議録
国際会議録
4. Optimization of scatterometry parameters for shallow trench isolation (STI) monitor
Leray, P.J. ; Cheng, S. ; Kremer, S. ; Ercken, M. ; Pollentier, I.
出版情報: Metrology, Inspection, and Process Control for Microlithography XVIII.  pp.576-586,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5375
5.

国際会議録
国際会議録
5. Evaluation of wet-developable KrF organic BARC to improve CD uniformity for implant application
Guilmeau, I.D. ; Guerrero, A.F. ; Blain, V. ; Kremer, S. ; Vachellerie, V. ; Lenoble, D. ; Nogueira, P. ; Mougel, S. ; Chapon, J.-D.
出版情報: Advances in Resist Technology and Processing XXI.  pp.461-470,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5376
6.

国際会議録
国際会議録
6. The CritiView: a new fiber optic based optical device for the assessment of tissue vitality [6083-36]
Mayevsky, A. ; Blum, Y. ; Dekel, N. ; Deutsch, A. ; Halfon, R. ; Kremer, S. ; Pewzner, E. ; Sherman, E. ; Barnea, O.
出版情報: Optical Fibers and Sensors for Medical Diagnostics and Treatment Applications VI.  pp.60830Z-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 6083
7.

国際会議録
国際会議録
7. Spectroscopic ellipsometry for lithography front-end level CD control: a complete analysis for production integration
Herisson, D. ; Neira, D. ; Fernand, C. ; Thony, P. ; Henry, D. ; Kremer, S. ; Polli, M. ; Guevremont, M. ; Elazami, A.
出版情報: Metrology, Inspection, and Process Control for Microlithography XVII.  1  pp.264-273,  2003.  Bellingham, WA.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5038