Blank Cover Image

Determination of Minority Carrier Diffusion Lengths in thi Denuded Zones of Silicon Wafers by Surface Photovoltage Measurements

著者名:
掲載資料名:
Proceedings of the Tenth International Workshop on the Physics of Semiconductor Devices (December 14-18, 1999)
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
3975
発行年:
2000
巻:
Part2
開始ページ:
908
終了ページ:
911
出版情報:
Bellingham, Wash.: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819436016 [0819436011]
言語:
英語
請求記号:
P63600/3975
資料種別:
国際会議録

類似資料:

Ma,Y., Lee,J.L., Benton,J.L., Boone,T., Eaglesham,D.J., Higashi,G.S.

SPIE-The International Society for Optical Engineering

Posada, Y., Balberg, I., Fonseca, L.F., Resto, O., Weisz, S.Z.

Materials Research Society

Faifer, V., Edelman, P., Kontkiewicz, A., Lagowski, J., Hoff, A., Dyukov, V., Pravdivtsev, A., Kornienko, I.

Electrochemical Society

Rath, H. J., Reffle, J., Huber, D., Eichinger, P., Iberl, F., Bernt, H.

Materials Research Society

Kontkiewicz, A. M., Lagowski, J., Dexter, M., Edelman, P.

MRS - Materials Research Society

Lowell, John, Wenner, Valerie, Debusk, Damon

MRS - Materials Research Society

Joshi, Subhash M., Gosele, Ulrich M., Tan, Teh Y.

MRS - Materials Research Society

Eichammer, Wolfgang A., Vu, Thuong-Quat, Siffert, P.

Materials Research Society

Lagowski, J., Faifer, V., Edelman, P.

Electrochemical Society

Jain, R.K., Flood, D.J.

National Aeronautics and Space Adminstration

Suzuki, E., Tamura, K., Onishe, K., Sekigawa, T.

Electrochemical Society

Schwarz, R., Dietrich, K., Goedecker, S., Kolodzey, J, Slobodin, D., Wagner, S.

Materials Research Society

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12