1.

国際会議録
国際会議録
1. Audio watermarking method robust against time-and frequency-fluctuation
Tachibana,R. ; Shimizu,S. ; Nakamura,T. ; Kobayashi,S.
出版情報: Security and Watermarking of Multimedia Contents III.  4314  pp.104-115,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4314
2.

国際会議録
国際会議録
2. Determination of relationship between Rayleigh wave velocity and stress with laser Doppler velocimeter
He,L.F. ; Kobayashi,S.
出版情報: Third International Conference on Experimental Mechanics : 15-17 October, 2001, Beijing China.  4537  pp.119-122,  2001.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4537
3.

国際会議録
国際会議録
3. GBR(groove baseband recording)for an optical disk ROM
Kobayashi,S. ; Horigome,T. ; Yamatsu,H. ; Masuhara,S. ; Saito,K.
出版情報: Optical data storage 2000 : 14-17 May, 2000, Whistler, Canada.  pp.12-15,  2000.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4090
4.

国際会議録
国際会議録
4. High Quality Powder Production of MA Amorphous TiAl System by Reaction Ball Milling
Kobayashi,S. ; Kimura,H.
出版情報: Mechanical alloying : proceedings of the International Symposium on Mechanical Alloying held in Kyoto, Japan, May 7-10, 1991.  pp.97-104,  1992.  Zurich.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 88-90
5.

国際会議録
国際会議録
5. Polarization-dependent losses of integrated optical splitters in glass
Hollenbach,U. ; Eckstein,H. ; Fabricius,N. ; Krause,M. ; Kobayashi,S.
出版情報: Functional Photonic and Fiber Devices.  pp.123-130,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 2695
6.

国際会議録
国際会議録
6. In-situ process monitoring in metal deposition processes
Kobayashi,S. ; Nishitani,E. ; Shimamura,H. ; Yajima,A. ; Kishimoto,S. ; Yoneoka,Y. ; Uchida,H. ; Morioka,N.
出版情報: Process, Equipment, and Materials Control in Integrated Circuit Manufacturing.  pp.80-90,  1995.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 2637
7.

国際会議録
国際会議録
7. MD1:Optical disk system for digital video recording.
Narahara,T. ; Kobayashi,S. ; Hattori,M. ; Shimpuku,Y. ; Enden,G.van den ; Kahlman,J.A. ; Dijk,M.van ; Woudenberg,R.van
出版情報: ISOM/ODS '99 : joint international symposium on Optical Memory and Optical Data Strage 1999, 11-15 July 1999 Sheraton Kauai Resort, Koloa, Howaii.  pp.50-52,  1999.  Bellingham, Washington.  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3864
8.

国際会議録
国際会議録
8. Development of simplified process for KrF excimer halftone mask with chrome-shielding method
Kobayashi,S. ; Oka,N. ; Watanabe,K. ; Ohmori,K. ; Inoue,M. ; Iguchi,K.
出版情報: 19th Annual Symposium on Photomask Technology : 15-17 September 1999, Monterey, California.  Part1  pp.288-296,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3873
9.

国際会議録
国際会議録
9. Photoalignment control of LC and its applications to LCD fabrication (Invited Paper)
Iimura,Y. ; Akiyama,H. ; Li,X.T. ; Kobayashi,S.
出版情報: Liquid Crystal Materials, Devices, and Applications VI.  pp.8-18,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3297
10.

国際会議録
国際会議録
10. Morphology of Oxide Precipitates in Czochralski Silicon Crystals
Sueoka,K. ; Ikeda,N. ; Yamamoto,T. ; Kobayashi,S.
出版情報: Shallow Impurities in Semiconductors : Proceedings of the Fifth International Conference on Shallow Impurities in Semiconductors "Physics and Control of Impurities", International Conference Center Kobe, Japan, 5 to 8 August, 1992.  pp.523-524,  1993.  Aedermannsdorf, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 117-118