1.

国際会議録
国際会議録
1. Measurement of the indium segregation in InGaN based LEDs with near single atom sensitivity
Jinschek, J.R. ; Kisielowski, C. ; Dyck, D.V. ; Geuens, P.
出版情報: Third international conference on solid state lighting : 5-7 August 2003, San Diego, California, USA.  pp.54-63,  2004.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5187
2.

国際会議録
国際会議録
2. X-ray Photoemission Spectromicroscopy of GaN and AlGaN
Lorusso, G. F. ; Solak, H. ; Cerrina, F. ; Underwood, J. H. ; Batson, P. J. ; Kim, Y. ; Cho, Y. ; Kisielowski, C. ; Krueger, J. ; Weber, E. R.
出版情報: Wide-bandgap semiconductors for high power, high frequency, and high temperature : symposium held April 13-15, 1998, San Francisco, California, U.S.A..  pp.393-,  1998.  Warrendale, Penn..  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 512
3.

国際会議録
国際会議録
3. High-quality GaN grown by molecular beam epitaxy on Ge(001)
Siegle, H. ; Kim, Y. ; Sudhir, G. S. ; Kruger, J. ; Perlin, P. ; Ager III, J. W. ; Kisielowski, C. ; Weber, E. R.
出版情報: Wide-bandgap semiconductors for high-power, high-frequency, and high temperature applications--1999 : symposium held April 5-8, 1999, San Francisco, California, U.S.A..  pp.451-,  1999.  Warrendale, PA.  MRS-Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 572
4.

国際会議録
国際会議録
4. MBE Growth of Strain Engineered GaN Thin Films Utilizing a Surfactant
Klockenbrink, R. ; Kim, Y. ; Leung, M. S. H. ; Kisielowski, C. ; Kruger, J. ; Sudhir, G. S. ; Rubin, M. ; Weber, E. R.
出版情報: Gallium nitride and related materials II : symposium held April 1-4, 1997, San Francisco, California, U.S.A..  pp.75-,  1997.  Pittsburgh, Pa..  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 468
5.

国際会議録
国際会議録
5. Stress-Controlled MBE Growth of GaN:Mg and GaN:Si
Kim, Y. ; Klockenbrink, R. ; Kisielowski, C. ; Kruger, J. ; Corlatan, D. ; Sudhir, G. S. ; Peyrot, Y. ; Cho, Y. ; Rubin, M. ; Weber, E. R.
出版情報: Nitride semiconductors : symposium held December 1-5, 1997, Boston, Massachusetts, U.S.A..  pp.217-,  1998.  Warrendale, Pa..  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 482
6.

国際会議録
国際会議録
6. QUANTITATIVE HRTEM: MEASURING PROJECTED POTENTIAL, SURFACE ROUGHNESS AND CHEMICAL COMPOSITION
Schwander, P. ; Kisielowski, C. ; Baumann, F. H. ; Kim, Y. O. ; Ourmazd, A.
出版情報: Determining nanoscale physical properties of materials by microscopy and spectroscopy.  pp.373-,  1994.  Pittsburgh, Pa..  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 332
7.

国際会議録
国際会議録
7. Stress Gradients in Heteroepitaxial Gallium Nitride Films
Ager, J. W., III. ; Conti, G. ; Romano, L. T. ; Kisielowski, C.
出版情報: Nitride semiconductors : symposium held December 1-5, 1997, Boston, Massachusetts, U.S.A..  pp.769-,  1998.  Warrendale, Pa..  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 482
8.

国際会議録
国際会議録
8. Properties of Homoepitaxially MBE-Grown GaN
Suski, T. ; Krueger, J. ; Kisielowski, C. ; Phatak, P. ; Leung, M. S. H. ; Liliental-Weber, Z. ; Gassmann, A. ; Newman, N. ; Rubin, M. D. ; Weber, E. R. ; Grzegory, I. ; Jun, J. ; Bockowski, M. ; Porowski, S. ; Helava, H. I.
出版情報: III-Nitride, SiC, and Diamond Materials for Electronic Devices : symposium held April, 1996, San Francisco, California, U.S.A..  pp.329-,  1996.  Pittsburgh, Pa..  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 423
9.

国際会議録
国際会議録
9. Effect of Mg, Zn, Si, and O on the Lattice Constant of Gallium Nitride Thin Films
Sudhir, G. S. ; Peyrot, Y. ; Kruger, J. ; Kim, Y. ; Klockenbrink, R. ; Kisielowski, C. ; Rubin, M. D. ; Weber, E. R. ; Kriegseis, W. ; Meyer, B. K.
出版情報: Nitride semiconductors : symposium held December 1-5, 1997, Boston, Massachusetts, U.S.A..  pp.525-,  1998.  Warrendale, Pa..  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 482
10.

国際会議録
国際会議録
10. Quantification of Displacement Fields From Lattice Images (HREM) and Electron Exit Waves in Nanostructured Composite Oxides
Calderon, H.A. ; Huerta, A. ; Kisielowski, C. ; Kilaas, R.
出版情報: Spatially resolved characterization of local phenomena in materials and nanostructures : symposium held December 2-5, 2002, Boston, Massachusetts, U.S.A..  pp.33-76,  2003.  Warrendale, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 738