Physics and simulation of optoelectronic devices VIII : 24-28 January 2000, San Jose, USA. Part2 pp.737-745, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995. pp.127-132, 1995. Zurich, Switzerland. Trans Tech Publications
Optical microlithography XIII : 1-3 March 2000, Santa Clara, USA. Part1 pp.723-733, 2000. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
17th Annual BACUS Symposium on Photomask Technology and Management. pp.430-440, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Medical Imaging 2000: PACS Design and Evaluation: Engineering and Clinical Issues. pp.312-320, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering