Medical Imaging 2006: Ultrasonic Imaging and Signal Processing. pp.61470C-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Smart structures and materials 2003 : Industrial and commercial applications of smart structures technologies : 4-6 March 2003, San Diego, California, USA. pp.240-251, 2003. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Smart structures and materials 2003 : Industrial and commercial applications of smart structures technologies : 4-6 March 2003, San Diego, California, USA. pp.252-262, 2003. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Medical Imaging 2004: Ultrasonic Imaging and Signal Processing. pp.290-299, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Kim, N.-K. ; Kim, K.-S. ; Kim, N.-H. ; Chang, E.-G.
出版情報:
State-of-the-art program on compound semiconductors XXXIX and nitride and wide bandgap semiconductors for sensors, photonics, and electronics IV : proceedings of the international symposia. pp.80-86, 2003. Pennington, N.J.. Electrochemical Society
Advances in resist technology and processing XXII : 28 February-2 March, 2005, San Jose, California, USA. pp.467-475, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Smart structures and materials 2003 : Smart sensor technology and measurement systems : 3-5 March 2003, San Diego, California, USA. pp.152-158, 2003. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Ganesan, R. ; Choi, J.-H. ; Yun, H.-J. ; Kwon, Y.-G. ; Kim, K.-S. ; Oh, T.-H. ; Kim, J.-B.
出版情報:
Advances in resist technology and processing XXII : 28 February-2 March, 2005, San Jose, California, USA. pp.40-51, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering