ULSI science and technology, 1997 : proceedings of the Sixth International Symposium on Ultralarge Scale Integration Science and Technology. pp.199-210, 1997. Pennington, NJ. Electrochemical Society
Morita, H. ; Joo, J.-D. ; Messoussi, R. ; Kawada, K. ; Kim, J.-S. ; Ohmi, T.
出版情報:
Proceedings of the Fifth International Symposium on Cleaning Technology in Semiconductor Device Manufacturing. pp.143-150, 1997. Pennington, NJ. Electrochemical Society
Proceedings of the Fifth International Symposium on Cleaning Technology in Semiconductor Device Manufacturing. pp.151-158, 1997. Pennington, NJ. Electrochemical Society
Park, K.-Y. ; Chol, H.-H. ; Kim, H.-K. ; Kim, J.-S. ; Kwon, S.-Y. ; Choi, S.-Y.
出版情報:
State-of-the-art program on compound semiconductors XXXVI and wide bandgap semiconductors for photonic and electronic devices and sensors II : proceedings of the international symposia. pp.213-224, 2002. Pennington, N.J.. Electrochemical Society
Chen, U. ; Buttry, D. ; Williams, M. ; Malmberg., J. ; Kim, J.-S.
出版情報:
Corrosion and corrosion prevention of low density metals and alloys : proceedings of the International Symposium. pp.29-40, 2000. Pennington, N.J.. Electrochemical Society
Proceedings of the Fifth International Symposium on Cleaning Technology in Semiconductor Device Manufacturing. pp.280-288, 1997. Pennington, NJ. Electrochemical Society
Kim, J.-S. ; Kinahan, P.E. ; Lartizien, C. ; Comtat, C. ; Lewellen, T.K.
出版情報:
Medical imaging 2003 : Image perception, observer performance, and technology assessment : 18-20 February 2003, San Diego, California, USA. pp.89-99, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Jeon, Y.-D. ; Choi, M.-K. ; Kim, E.-J. ; Kim, J.-S. ; Oh, H.-K.
出版情報:
Emerging lithographic technologies IX : 1-3 March 2005, San Jose, California, USA. pp.56-63, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Materials for infrared detectors II : 8-9 July 2002 ,Seattle, Washington, USA. pp.207-212, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
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