1.

国際会議録
国際会議録
1. Semiconductor polycrystalline alpha detectors [6319A-36]
Schieber, M. ; Roth, M. ; Zuck, A. ; Marom, G. ; Khakhan, O. ; Alfassi, Z. B.
出版情報: Hard X-ray and gamma-ray detector physics and Penetrating radiation systems VIII : 14-17 August 2006, San Diego, California, USA.  pp.631914-631914,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 6319
2.

国際会議録
国際会議録
2. Nuclear spectroscopy with polycrystalline-Pbl2 radiation detectors [5922-11]
Schieber, M. ; ZZAmoshchuk, N. ; Khakhan, O. ; Zuck, A.
出版情報: Hard X-ray and gamma-ray detector physics VII : 1-3 August 2005, San Diego, California.  pp.59220B-,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5922
3.

国際会議録
国際会議録
3. Delayed emission of surface-generated trapped carriers in transient charge transport of single-crystal and policrystalline Hgl2
Zuck, A. ; Schieber, M.M. ; Khakhan, O. ; Burshtein, Z.
出版情報: X-ray and gamma-ray detectors and applications IV : 7-9 July Seattle, Washington, USA.  pp.279-287,  2002.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4784