1.

国際会議録
国際会議録
1. High-resolution measurement of crack growth in micro-machined crystal silicon
Fitzgerald, A. M. ; Dauskardt, R. H. ; Kenny, T. W.
出版情報: Materials science of microelectromechanical systems (MEMS) devices II : symposium held November 29-December 1, 1999, Boston, Massachusetts, U.S.A..  pp.43-,  2000.  Warrendale, Pa..  MRS-Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 605
2.

国際会議録
国際会議録
2. Development of superconducting transition edge sensors for time- and energy-resolved single-photon counters with application to imaging astronomy
Bay, T. J. ; Burney, J. A. ; Brink, P. L. ; Cabrera, B. ; Castle, J. P. ; Romani, R. W. ; Tomada, A. ; Young, B. A. ; Nam, S. W. ; Miller, A. J. ; Martinis, J. M. ; Kenny, T. W. ; Wang, E.
出版情報: Materials for infrared detectors III : 7-8 August 2003, San Diego, California, USA.  pp.192-200,  2003.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5209
3.

国際会議録
国際会議録
3. Fundamental noise in MEMS force sensors (Invited Paper)
Kenny, T. W. ; Liang, Y. ; Pruitt, B. L. ; Harley, J. A. ; Bartsch, M. ; Rudnitsky, R.
出版情報: Noise and Information in Nanoelectronics, Sensors, and Standards II.  pp.143-151,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5472