1.

国際会議録
国際会議録
1. Physical and reliability issues in MEMS microrelays with gold contacts
Lafontan,X. ; Pressecq,F. ; Perez,G. ; Dufaza,C. ; Karam,J.-M.
出版情報: Reliability, testing, and characterization of MEMS/MOEMS : 22-24 October 2001, San Trancisco, USA.  pp.11-21,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4558
2.

国際会議録
国際会議録
2. Simple effective tests for beam propagation method programs
Dumitrescu,M.M. ; Iancu,O.D. ; Karam,J.-M.
出版情報: SIOEL '99 : Sixth Symposium on Optoelectronics : 22-24 September 1999, Bucharest, Romania.  pp.413-422,  2000.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4068
3.

国際会議録
国際会議録
3. Microsystem design framework based on tool adaptations and library developments
Karam,J.-M. ; Courtois,B. ; Rencz,M. ; Poppe,A. ; Szekely,V.
出版情報: Microlithography and Metrology in Micromachining II.  pp.236-245,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 2880
4.

国際会議録
国際会議録
4. CAD framework concept for the design of integrated microsystems
Poppe,A. ; Rencz,M. ; Szekely,V. ; Karam,J.-M. ; Courtois,B. ; Hofmann,K. ; Glesner,M.
出版情報: Micromachined Devices and Components.  pp.215-224,  1995.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 2642