1.

国際会議録
国際会議録
1. 586a. Controlling Ultrashallow Junction Formation through Surface Chemistry
Edmund G. Seebauer ; Kapil Dev ; Charlotte T.M. Kwok ; Richard D. Braatz
出版情報: 2005 annual meeting & fall showcase : '05 AIChE, Oct 30 - Nov 4 : conference proceedings, Cincinnati Convention Center, Cincinnati, OH : non-topical presentation records : 08. Materials Engineering and Sciences Division.  2005.  New York.  American Institute of Chemical Engineers
シリーズ名: AIChE Conference Proceedings
シリーズ巻号: P-221(2)
2.

国際会議録
国際会議録
2. 135a. Control of Defect Concentrations in Silicon through Surface Chemistry
Ramakrishnan Vaidyanathan ; Kapil Dev ; Richard D. Braatz ; Edmund G. Seebauer
出版情報: 2005 annual meeting & fall showcase : '05 AIChE, Oct 30 - Nov 4 : conference proceedings, Cincinnati Convention Center, Cincinnati, OH : non-topical presentation records : 01. Engineering Sciences and Fundamentals.  2005.  New York.  American Institute of Chemical Engineers
シリーズ名: AIChE Conference Proceedings
シリーズ巻号: P-221(2)