1.

国際会議録
国際会議録
1. Avalanche photodiodes: present and future
Mikawa,T. ; Kobayashi,M. ; Kaneda,T.
出版情報: Active and passive optical components for WDM communication, 21-24 August 2001, Denver, USA.  pp.139-145,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4532
2.

国際会議録
国際会議録
2. High-numerical-aperture objective lenses and optical system improved objective type total internal reflection fluorescence microscopy
Kawano,Y. ; Abe,C. ; Kaneda,T. ; Aono,Y. ; Abe,K. ; Tamurap,K. ; Terakawa,S.
出版情報: Optical devices and diagnostics in materials science, 1-4 August 2000, San Diego, USA.  pp.142-151,  2000.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4098
3.

国際会議録
国際会議録
3. Photoinduced Defects in CdS-Doped Glasses
Miyoshi,T. ; Towata,K. ; Matsuki,H. ; Matsuo,N. ; Kaneda,T.
出版情報: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.573-577,  1995.  Zurich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 196-201
4.

国際会議録
国際会議録
4. High-strain-rate fracture behavior of steel: the new application of a high-speed video camera to the fracture initiation experiments of steel
Suzuki,G. ; Ichinose,K. ; Gomi,K. ; Kaneda,T.
出版情報: Ultrahigh- and High-Speed Photography and Image-based Motion Measurement.  pp.107-114,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3173