1.

国際会議録
国際会議録
1. Material testing of laser welds and claddings using digital speckle photography
Holstein,D. ; Juptner,W.P.
出版情報: Laser metrology for precision measurement and inspection in industry : 13-15 October 1999, Florianópolis, Brazil.  pp.51-58,  1999.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4420
2.

国際会議録
国際会議録
2. New light sources and sensors for active optical 3D inspection
Osten,W. ; Juptner,W.P.
出版情報: Advanced photonic sensors and applications : 30 November-3 December 1999, Singapore.  pp.314-327,  1999.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3897
3.

国際会議録
国際会議録
3. Light-in-flight measurements by digital holography
Juptner,W.P. ; Pomarico,J.A. ; Schnars,U.
出版情報: Laser interferometry VIII--techniques and analysis : 6-7 August, 1996, Denver Colorado.  pp.135-141,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 2860
4.

国際会議録
国際会議録
4. NDT on wide-scale aircraft structures with digital speckle shearography
Kalms,M.K. ; Osten,W. ; Juptner,W.P. ; Bisle,W. ; Scherling,D. ; Tober,G.
出版情報: Optical measurement systems for industrial inspection : 16-17 June 1999, Munich, Germany.  pp.280-286,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3824
5.

国際会議録
国際会議録
5. Application of digital speckle photography for local strain analysis
Holstein,D. ; Theiler,C. ; Hartmann,H.-J. ; Juptner,W.P.
出版情報: Optical measurement systems for industrial inspection : 16-17 June 1999, Munich, Germany.  pp.229-236,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3824
6.

国際会議録
国際会議録
6. Modern approaches for absolute phase measurement
Osten,W. ; Andra,P. ; Nadeborn,W. ; Juptner,W.P.
出版情報: International Conference on Holography and Correlation Optics : 15-19 May 1995, Chernovtsy, Ukraine.  pp.529-540,  1995.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 2647
7.

国際会議録
国際会議録
7. Determination of geometric properties of SNOM tips by means of far-field evaluation
Seebacher,S. ; Osten,W. ; Juptner,W.P. ; Veiko,V.P. ; Voznessenski,N.B.
出版情報: Optical devices and diagnostics in materials science, 1-4 August 2000, San Diego, USA.  pp.110-120,  2000.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4098
8.

国際会議録
国際会議録
8. Inverse projected fringe technique
Kalms,M.K. ; Osten,W. ; Juptner,W.P.
出版情報: Second International Conference on Experimental Mechanics : 29 November-1 December 2000, Singapore.  pp.505-510,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4317
9.

国際会議録
国際会議録
9. Optical inspection of large-scale technical components
Juptner,W.P. ; Osten,W. ; Kalms,M.K.
出版情報: Optical measurement systems for industrial inspection : 16-17 June 1999, Munich, Germany.  pp.210-216,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3824
10.

国際会議録
国際会議録
10. Automatic adaption of projected fringe patterns using a programmable LCD projector
Kalms,M.K. ; Juptner,W.P. ; Osten,W.
出版情報: Sensors, sensor systems, and sensor data processing : June 16-17 1997, Munich, FRG.  pp.156-165,  1997.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3100