1.

国際会議録
国際会議録
1. HIGH-RESOLUTION X-RAY DIFFRACTION MEASUREMENTS OF SiGe/Si STRUCTURES
Jordan-Sweet, J. L. ; Mooney, P. M. ; Stephenson, G. B.
出版情報: Applications of synchrotron radiation techniques to materials science II : symposium held November 27-December 2, 1994, Boston, Massachusetts, USA.  pp.201-,  1995.  Pittsburgh, Pa..  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 375
2.

国際会議録
国際会議録
2. Analysis of SiGe FET Device Structures on Silicon-on-Sapphire Substrates by X-ray Diffraction
Mooney, P. M. ; Chu, J. O. ; Ott, J. A. ; Jordan-Sweet, J. L. ; Dubbelday, W. B. ; Kavanagh, K. L. ; Lagnado, I. ; Meyerson, B. S.
出版情報: Epitaxy and applications of si-based heterostructures : symposium held April 13-17, 1998, San Francisco, California, U.S.A..  pp.55-,  1998.  Warrendale, Pa..  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 533