1.
国際会議録
Barefoot, A.C. ; Clay, V.E. ; Hendley, P. ; Jones, R.L.
出版情報:
Terrestrial field dissipation studies : purpose, design, and interpretation . pp.1-13, 2003. Washington, D.C.. American Chemical Society
シリーズ名:
ACS symposium series
シリーズ巻号:
842
2.
国際会議録
Jones, R.L. ; Parsons, R.G. ; Gatzweiler, E.W. ; Wicks, R.J. ; Leake, C.R.
出版情報:
The lysimeter concept : environmental behavior of pesticides . pp.203-212, 1998. Washington, DC. American Chemical Society
シリーズ名:
ACS symposium series
シリーズ巻号:
699
3.
国際会議録
Vogt, B.D. ; Soles, C.L. ; Prabhu, V.M. ; Jones, R.L. ; Wu, W.-L. ; Lin, E.K. ; Goldfarb, D.L. ; Angelopoulos, M.
出版情報:
Advances in Resist Technology and Processing XXI . pp.56-62, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
5376
4.
国際会議録
Jones, R.L. ; Byers, J.D. ; Conley, W.
出版情報:
Metrology, Inspection, and Process Control for Microlithography XVII . 1 pp.663-673, 2003. Bellingham, WA. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
5038
5.
国際会議録
Jones, R.L. ; Hu, T. ; Lin, E.K. ; Wu, W. ; Casa, D.M. ; Orji, N.G. ; Vorburger, T.V. ; Bolton, P.J. ; Barclay, G.G.
出版情報:
Metrology, Inspection, and Process Control for Microlithography XVII . 1 pp.191-199, 2003. Bellingham, WA. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
5038
6.
国際会議録
Jones, R.L. ; Byers, J.D.
出版情報:
Optical Microlithography XVI . Part Two pp.1035-1043, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
5040
7.
国際会議録
Lin, E.K. ; Jones, R.L. ; Wu, W.-L. ; Barker, J.G. ; Bolton, P.J. ; Barclay, G.G.
出版情報:
Metrology, Inspection, and Process Control for Microlithography XVI . Part One pp.541-548, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
4689
8.
国際会議録
Jones, R.L. ; Mack, C.A. ; Byers, J.D.
出版情報:
Optical Microlithography XV . Part Two pp.1232-1242, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
4691
9.
国際会議録
Jones, R.L. ; Soles, C.L. ; Starr, F.W. ; Lin, E.K. ; Lenhart, J.L. ; Wu, W.-L. ; Goldfarb, D.L. ; Angelopoulos, M.
出版情報:
Advances in Resist Technology and Processing XIX . Part One pp.342-350, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
4690
10.
国際会議録
Lin, E.K. ; Soles, C.L. ; Goldfarb, D.L. ; Trinque, B.C. ; Burns, S.D. ; Jones, R.L. ; Lenhart, J.L. ; Angelopoulos, M. ; Willson, C.G. ; Satija, S.K. ; Wu, W.-L.
出版情報:
Advances in Resist Technology and Processing XIX . Part One pp.313-320, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
4690