Wang, Z. ; Du, C. ; Zhang, H. ; Ruan, S. ; Xu, X. ; Wang, J. ; Shao, Z. ; Jiang, M.
出版情報:
ICO20 : lasers and laser technologies : 21-26 August, 2005, Changchun, China. pp.60280E-, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Jiang, M. ; Zhou, T. ; Cheng, J. ; Cong, W. ; Wang, G.
出版情報:
Developments in X-ray tomography V : 15-17 August 2006, San Diego, California, USA. pp.63180E-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Remote sensing for environmental monitoring, GIS applications, and geology V : 19-20 September 2005, Bruges, Belgium. pp.598303-598304, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Zhao, H.D. ; Chi, H. ; Zeng, Q.J. ; Xiao, S.L. ; Jiang, M.
出版情報:
Metro and access networks II : APOC 2002 : Asia-Pacific Optical and Wireless Communications : 16-17 October, 2002, Shanghai, China. pp.183-192, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Metro and access networks II : APOC 2002 : Asia-Pacific Optical and Wireless Communications : 16-17 October, 2002, Shanghai, China. pp.193-200, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Developments in X-ray tomography IV : 4-6 August, 2004, Denver, Colorado, USA. pp.599-610, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Developments in X-ray tomography IV : 4-6 August, 2004, Denver, Colorado, USA. pp.531-539, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering