1.

国際会議録
国際会議録
1. Imaging the evanescent intensity gradients of an optical waveguide using a tapping-mode near-field scanning optical microscope
Yang,C.W. ; Tsai,D.P. ; Jackson,H.E.
出版情報: Design, fabrication, and characterization of photonic devices : 30 November-3 December 1999, Singapore.  pp.313-318,  1999.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3896
2.

国際会議録
国際会議録
2. MOEMS pressure sensors for propulsion applications
Boyd,J.T. ; Dasgupta,S. ; Jackson,H.E.
出版情報: MOEMS and miniaturized systems : 18-20 September 2000, Santa Clara, USA.  pp.380-386,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4178
3.

国際会議録
国際会議録
3. Design and fabrication of optical-MEMS pressure sensor arrays
Dasgupta,S. ; Zhou,J. ; Wolff,J.M. ; Jackson,H.E. ; Boyd,J.T.
出版情報: MOEMS and miniaturized systems : 18-20 September 2000, Santa Clara, USA.  pp.372-378,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4178
4.

国際会議録
国際会議録
4. Use of near-field scanning optical microscopy(NSOM)to characterize optical channel waveguide structures
Naghski,D.H. ; Lindsay,S.M. ; Poweleit,C.D. ; Brabander,G.N.De ; Subramaniam,V. ; Jackson,H.E. ; Boyd,J.T.
出版情報: Integrated Optics and Microstructures III.  pp.64-72,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 2686