1.

国際会議録
国際会議録
1. Surface Voltage and μPCD Mapping of Defect in Epitaxial SiC
M. Wilson ; A. Savtchouk ; A. Findlay ; J. Lagowski ; P. Edelman
出版情報: Silicon Carbide and Related Materials 2015 : [ICSCRM 2015] : selected, peer reviewed papers from the 16th International Conference on Silicon Carbide and Related Materials, October 4-9, 2015, Giardini Naxos, Italy.  pp.353-356,  2016.  Aedermannsdorf, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 858
2.

国際会議録
国際会議録
2. Accurate Doping Density Determination in SiC with Constant Surface Potential Corona Charging; Industry Ready Alternative to Hg-CV
A. Savtchouk ; M. Wilson ; J. Lagowski ; A. Czett ; C. Buday
出版情報: Silicon Carbide and Related Materials 2015 : [ICSCRM 2015] : selected, peer reviewed papers from the 16th International Conference on Silicon Carbide and Related Materials, October 4-9, 2015, Giardini Naxos, Italy.  pp.509-512,  2016.  Aedermannsdorf, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 858
3.

国際会議録
国際会議録
3. The Present Status and Recent Advancements in Corona-Kelvin Non-Contact Electrical Metrology of Dielectrics for IC-Manufacturing
M. Wilson ; D. Marinskiy ; A. Byelyayev ; J. D'Amico ; A. Findlay ; L. Jastrzebski ; J. Lagowski
出版情報: Physics and technology of high-k gate dielectrics 4.  pp.3-24,  2006.  Pennington, N.J..  Electrochemical Society
シリーズ名: ECS transactions
シリーズ巻号: 3(3)
4.

国際会議録
国際会議録
4. Non-Contact Photo-Assisted Charge-Based Characterization of Dielectric Interfaces in SiC: Evidence of Slow States
A. Savtchouk ; M. Wilson ; J. Lagowski
出版情報: Silicon Carbide and Related Materials 2016.  pp.139-142,  2017.  Aedermannsdorf, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 897
5.

国際会議録
国際会議録
5. New approach to measuring oxide charge and mobile ion concentration
P. Edelman ; A.M. Hoff ; L. Jastrzebski ; J. Lagowski
出版情報: Optical characterization techniques for high-performance microelectronic device manufacturing : 20 October 1994, Austin, Texas.  pp.154-164,  1994.  Bellingham, WA.  Society of Photo-optical Instrumentation Engineers
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 2337