Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997. Part2 pp.1149-1154, 1997. Zurich, Switzerland. Trans Tech Publications
Sixth International Symposium on Atmospheric and Ocean Optics : 23-26 June 1999, Tomsk, Russia. pp.443-449, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
ICONO '98 : nonlinear optical phenomena and coherent optics in information technologies : 29 June-3 July 1998, Moscow, Russia. pp.204-210, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Seventh international symposium on atmospheric and ocean optics : 19-22 July 2000, Tomsk, Russia. pp.339-342, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Silicon carbide, III-nitrides and related materials, ICSCIII-N'97 : proceedings of the International Conference on Silicon Carbide, III-Nitrides and Related Materials, Stockholm, Sweden, September 1997. Part2 pp.1343-1346, 1998. Zuerich, Switzerland. Trans Tech Publications
Ultrafast phenomena in semiconductors : proceedings of the 10th International Symposium on Ultrafast Phenomena in Semiconductors (10-UFPS), held in Vilnius, Lithuania, August/September, 1998. pp.229-232, 1999. Zurich-Uetikon, Switzerland. Trans Tech Publications
ALT '97, International Conference on Laser Surface Processing : 8-12 September 1997, Limoges, France. pp.449-458, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Applications of digital image processing XIX : 7-9 August 1996, Denver, Colorado. pp.713-719, 1996. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering