Inoue, J. ; Nakayama, T. ; Suzuki, T. ; Suematsu, H. ; Jiang, W. ; Niihara, K.
出版情報:
Eco-materials processing & design VII : proceedings of the Conference of the 7th International Symposium on Eco-materials Processing & Design, January 8-11 2006, Chengdu, China. pp.1006-1009, 2006. Uetikon-Zuerich. Trans Tech Publications
Proceedings of the International Conference on Excitonic Processes in Condensed Matter : EXCON '98. pp.471-476, 1998. Pennington, N. J.. Electrochemical Society
Inoue, J. ; Ishido, Y. ; Takeshima, T. ; Matsuura, N.
出版情報:
Sensors, systems, and next-generation satellites VII : 8-10 September 2003, Barcelona, Spain. pp.53-63, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Kurihara, S. ; Murakami, H. ; Tanaka, K. ; Hashimoto, T. ; Asanuma, I. ; Inoue, J.
出版情報:
Sensors, systems, and next-generation satellites VII : 8-10 September 2003, Barcelona, Spain. pp.11-19, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Murakami, H. ; Tanaka, K. ; Kurihara, S. ; Okamura, Y. ; Inoue, J. ; Nieke, J. ; Asanuma, I. ; Yatagai, H. ; Mitomi, Y. ; Yoshida, M. ; Higuchi, R. ; Kawamoto, S. ; Isono, K. ; Senga, Y.
出版情報:
Ocean remote sensing and imaging II : 5-6 August 2003, San Diego, California, USA. pp.73-82, 2003. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Advances in materials problem solving with the electron microscope : symposium held November 30-December 3, 1999, Boston, Massachusetts, U.S.A.. pp.51-56, 2001. Pittsburgh, Pa.. Materials Research Society
Isu, T. ; Inoue, J. ; Akahane, J. ; Sotobayashi ; Tsuchiya, M.
出版情報:
Nanophotonics for Communication: Materials, Devices, and Systems III. pp.639309-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Matsui, M. ; Machida, S. ; Mine, T. ; Hozawa, K. ; Watanabe, K. ; Goto, Y. ; Inoue, J. ; Nagaishi, H.
出版情報:
Metrology, Inspection, and Process Control for Microlithography XX. pp.61521S-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
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