1.

国際会議録
国際会議録
1. Submillimeter limb-emission sounder JEM/SMILES aboard the space station
Inatani,J. ; Ozeki,H. ; Satoh,R. ; Nishibori,T. ; Ikeda,N. ; Fujii,Y. ; Nakajima,T. ; Iida,Y. ; Iida,T. ; Kikuchi,K. ; Miura,T. ; Masuko,H. ; Manabe,T. ; Ochiai,S. ; Seta,M. ; Irimajiri,Y. ; Kasai,Y. ; Suzuki,M. ; Shirai,T. ; Tsujimaru,S.
出版情報: Microwave remote sensing of the atmosphere and environment II : 9-12 October 2000, Sendai, Japan.  pp.243-254,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4152
2.

国際会議録
国際会議録
2. AlGaAs-based two-dimensional photonic crystal with defect waveguides for miniaturized ultrafast optical-pulse control-delay devices
Sugimoto,Y. ; Ikeda,N. ; Carlsson,N. ; Kawai,N. ; Inoue,K. ; Asakawa,K.
出版情報: Active and passive optical components for WDM communication, 21-24 August 2001, Denver, USA.  pp.180-190,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4532
3.

国際会議録
国際会議録
3. Development of superconducting submillimeter-wave limb emission sounder (JEM/SMILES) aboard the International Space Station
Ozeki,H. ; Inatani,J. ; Satoh,R. ; Nishibori,T. ; Ikeda,N. ; Fujii,Y. ; Nakajima,T. ; Iida,Y. ; Iida,T. ; Kikuchi,K. ; Miura,T. ; Masuko,H. ; Manabe,T. ; Ochiai,S. ; Seta,M. ; Irimajiri,Y. ; Kasai,Y. ; Suzuki,M. ; Shirai,T. ; Tsujimaru,S.
出版情報: Sensors, systems, and next-generation satellites V : 17-20 September 2001, Toulouse, France.  pp.209-220,  2001.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4540
4.

国際会議録
国際会議録
4. Morphology of Oxide Precipitates in Czochralski Silicon Crystals
Sueoka,K. ; Ikeda,N. ; Yamamoto,T. ; Kobayashi,S.
出版情報: Shallow Impurities in Semiconductors : Proceedings of the Fifth International Conference on Shallow Impurities in Semiconductors "Physics and Control of Impurities", International Conference Center Kobe, Japan, 5 to 8 August, 1992.  pp.523-524,  1993.  Aedermannsdorf, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 117-118