1.

国際会議録
国際会議録
1. *X-RAY MICROPROBE FOR THE MICROCHARACTERIZATION OF MATERIALS
Sparks, C. J. ; Ice, G. E.
出版情報: Synchrotron radiation in materials research : symposium held November 28-30, 1988, Boston, Massachusetts, U.S.A..  pp.223-234,  1989.  Pittsburgh, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 143
2.

国際会議録
国際会議録
2. X-RAY DIFFRACTION STUDY OF A THIN GaAs FILM ON Si (100)
Bommannavar, Arun S. ; Sparks, C. J. ; Habenschuss, A. ; Ice, G. E. ; Dhere, A. ; Morkoc, H. ; Zabel, H.
出版情報: Epitaxy of semiconductor layered structures : symposium held November 30-December 4, 1987, Boston, Massachusetts, U.S.A..  pp.223-228,  1988.  Pittsburgh, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 102
3.

国際会議録
国際会議録
3. Submicron Resolution X-RAY Strain Measurements on patterned Films: Some Hows and Whys
Marcus, M. A. ; Macdowell, A. A. ; Isaacs, E. D. ; Evans-Lutterodt, K. ; Ice, G. E.
出版情報: Materials reliability in microelectronics VI : symposium held April 8-12, 1996, San Francisco, California, U.S.A..  pp.545-,  1996.  Pittsburgh, Pa..  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 428
4.

国際会議録
国際会議録
4. RECOVERY OF SRO PARAMETERS AND PAIRWISE ATOMIC DISPLACEMENTS IN A Fe46.5Ni53.5 ALLOY
Jiang, X. ; Ice, G. E. ; Sparks, C. J. ; Zschack, P.
出版情報: Applications of synchrotron radiation techniques to materials science II : symposium held November 27-December 2, 1994, Boston, Massachusetts, USA.  pp.267-,  1995.  Pittsburgh, Pa..  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 375
5.

国際会議録
国際会議録
5. 3-D measurement of deformation microstructure in Al(0.2%)Mg using submicron resolution white X-ray microbeams
Larson, B. C. ; Tamura, N. ; Chung, J-S. ; Ice, G. E. ; Budai, J. D. ; Tischler, J. Z. ; Yang, W. ; Weiland, H. ; Lowe, W. P.
出版情報: Applications of synchrotron radiation techniques to materials science V : sympoisum held November 29-December 3, 1999, Boston, Massachusetts, U.S.A..  pp.247-,  2000.  Warrendale, Pa..  MRS-Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 590
6.

国際会議録
国際会議録
6. Strain and Texture in Al-Interconnect Wires Measured by X-ray Microbeam Diffraction
Tamura, N. ; Chung, J-S. ; Ice, G. E. ; Larson, B. C. ; Budai, J. D. ; Tischler, J. Z. ; Yoon, M. ; Williams, E. L. ; Lowe, W. P.
出版情報: Materials reliability in microelectronics IX : symposium held April 6-8, 1999, San Francisco, California, U.S.A..  pp.175-,  1999.  Pittsburgh, Pa..  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 563
7.

国際会議録
国際会議録
7. X-ray Microbeam Measurement of Local Texture and Strain in Metals
Chung, J-S. ; Tamura, N. ; Ice, G. E. ; Larson, B. C. ; Budai, J. D. ; Lowe, W.
出版情報: Materials reliability in microelectronics IX : symposium held April 6-8, 1999, San Francisco, California, U.S.A..  pp.169-,  1999.  Pittsburgh, Pa..  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 563
8.

国際会議録
国際会議録
8. Comparison of a Mosaic-Crystal Spectrometer to a High-Performance Solid-State Detector for X-ray Microfluorescence Analysis
Chung, J-S. ; Isa, S. ; Sparks, C. J. ; Ice, G. E. ; McHugo, S. ; Thompson, A.
出版情報: Applications of synchrotron radiation techniques to materials science IV : sympoisum held April 13-17, 1998, San Francisco, California, U.S.A..  pp.153-,  1998.  Warrendale, Penn..  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 524
9.

国際会議録
国際会議録
9. X-ray Fluorescence Microtomography on a SiC Nuclear Fuel Shell
Naghedolfeizi, M. ; Chung, J-S. ; Ice, G. E. ; Yun, W. B. ; Cai, Z. ; Lai, B.
出版情報: Applications of synchrotron radiation techniques to materials science IV : sympoisum held April 13-17, 1998, San Francisco, California, U.S.A..  pp.233-,  1998.  Warrendale, Penn..  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 524
10.

国際会議録
国際会議録
10. Characterization of Stress Relaxation, Dislocations and Crystallographic Tilt Via X-ray Microdiffraction in GaN (0001) Layers Grown by Maskless Pendeo-Epitaxy
Barabash, R. I. ; Ice, G. E. ; Liu, W. ; Einfeldt, S. ; Hommel, D. ; Roskowski, A. M. ; Davis, R. F.
出版情報: Thin films : stresses and mechanical properties XI : symposium held March 28-April 1, 2005, San Francisco, California, U.S.A..  pp.115-120,  2005.  Warrendale, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 875