Huang, Y.L. ; Li, J. ; Xiang, Y. ; Ma, X.R. ; Kai, G.Y. ; Dong, X.Y.
出版情報:
Optical components and transmission systems : APOC 2002 : Asia-Pacific Optical and Wireless Communications : 16-18 October, 2002, Shanghai, China. pp.90-93, 2002. Bellingham, Washington. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Advanced sensor systems and applications : 15-18 October 2002, SHanghai, China. pp.454-458, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Advanced sensor systems and applications : 15-18 October 2002, SHanghai, China. pp.487-491, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Proceedings of the Second International Symposium on Low and High Dielectric Constant Materials : Materials Science, Processing, and Reliability Issues. pp.209-213, 1997. Pennington, NJ. Electrochemical Society
Optical fiber and fiber component mechanical reliability and testing II : 21 January 2002, San Jose, USA. pp.40-44, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Advanced sensor systems and applications : 15-18 October 2002, SHanghai, China. pp.441-444, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Job, R. ; Ulyashin, A.G. ; Huang, Y.L. ; Fahrner, W.R. ; Simoen, E. ; Claeys, C. ; Niedernostheide, F.-J. ; Schulze, H.-J. ; Tonelli, G.
出版情報:
Defect and impurity engineered semiconductors and devices III : symposium held April 1-5, 2002, San Francisco, California, U.S.A.. pp.257-262, 2002. Warrendale, Pa. Materials Research Society
Topical Conference on Batch Processing : presentation record of the topical conference held in conjunction with the American Institute of Chemical Engineers, 2001 annual meeting, November 5-9, 2001, Reno, NV. pp.166-176, 2001. New York. American Institute of Chemical Engineers