1.

国際会議録
国際会議録
1. Measurement of abrasion of polyethelene TEP catyles ABG I of coax using opticlal scanning topography [5945-32]
Mandat, D. ; No-ka, L. ; Hrabovsk-, M.
出版情報: 14th Slovak-Czech-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics.  pp.59450W-,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5945
2.

国際会議録
国際会議録
2. Potentialigies of optical profilometer MicroProf FRT for surface quality measurement [5945-36]
R-ssler, T. ; Hrabovsk-, M. ; Pluha-ek, f.
出版情報: 14th Slovak-Czech-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics.  pp.594511-594511,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5945