1.

国際会議録
国際会議録
1. Study and design of a liquid level meter based on fiber optic sensing technology
Wang, Z. ; Wang, Y. ; Hou, P.
出版情報: Advanced sensor systems and applications II : 8-12 November 2004, Beijing, China.  pp.489-493,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5634
2.

国際会議録
国際会議録
2. A method for displacement measurement based on reciprocal interferometry with spectrum analysis techniques
Wang, Y. ; Zhang, Y. ; Hou, P. ; Zheng, L.
出版情報: Advanced sensor systems and applications II : 8-12 November 2004, Beijing, China.  pp.457-465,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5634
3.

国際会議録
国際会議録
3. Chemical and Morphological Changes at Al2O3/NiAl Interfaces and Their Relationship to Scale Adhesion
Hou, P.
出版情報: High temperature corrosion and materials chemistry : proceedings of the International Symposium.  pp.40-50,  2003.  Pennington, New Jersey.  Electrochemical Society
シリーズ名: Electrochemical Society Proceedings Series
シリーズ巻号: 2003-16
4.

国際会議録
国際会議録
4. Dynamic detection on water quality and water areas of Nanishu Lakes with remote sensing
Yang, F. ; Han, Z. ; Zhang, F. ; Cao, G. ; Hou, P. ; Tang, Z. ; Lu, M. ; Li, X.
出版情報: Multispectral and hyperspectral remote sensing instruments and applicaionts :25-27 October 2002, Hangzhou, China.  pp.227-236,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4897
5.

国際会議録
国際会議録
5. Oxidation Protective Coating onto Ferritic Interconnect by Nanocrystalline Perovskite Thin Films
Zhou, X.-D. ; Belogolovsky, I. ; Scarfino, B.J. ; Reis, S.T. ; Brow, R.K. ; Hou, P. ; Anderson, H.U.
出版情報: High temperature corrosion and materials chemistry : proceedings of the International Symposium.  pp.159-169,  2005.  Pennington, New Jersey.  Electrochemical Society
シリーズ名: Electrochemical Society Proceedings Series
シリーズ巻号: 2004-16
6.

国際会議録
国際会議録
6. The application study of the infrared imaging technology on the transformer fault diagnosis
Hou, P. ; Wang, Y. ; Meng, Z.
出版情報: Infrared components and their applications : 8-11 November 2004, Beijing, China.  pp.253-259,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5640
7.

国際会議録
国際会議録
7. Methylation oligonucleotide microarray: a novel tool to analyze methylation patterns
Hou, P. ; Ji, M. ; He, N. ; Lu, Z.
出版情報: Bioengineered and bioinspired systems : 19-21 May 2003 Maspalomas, Gran Canaria, Spain.  pp.60-67,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5119
8.

国際会議録
国際会議録
8. Application of multidata fusion in the gold forming prediction
Cao, G. ; Yang, F. ; Li, H. ; Hou, P.
出版情報: Remote sensing for environmental monitoring, GIS applications, and geology III :9-11 September 2003, Barcelona, Spain.  pp.174-184,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5239
9.

国際会議録
国際会議録
9. Analysis and research of remote sensing for suspended sediment in water
Hou, P. ; Wang, L. ; Cao, G. ; Yang, F.
出版情報: Remote sensing for environmental monitoring, GIS applications, and geology III :9-11 September 2003, Barcelona, Spain.  pp.89-97,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5239
10.

国際会議録
国際会議録
10. Characterization of thin films and stack in MOEMS structure with ellipsometry and reflectometry techniques
Sun, L. ; Hou, P.
出版情報: Micromachining and Microfabrication Process Technology X.  pp.167-173,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5715