1.

国際会議録
国際会議録
1. AC PHOTOVOLTAIC INSPECTION OF P-N JUNCTIONS HAVING HIGH LEAKAGE CURRENT
Honma, N. ; Shimizu, H. ; Munakata, C. ; Ogasawara, M.
出版情報: Impurities, defects, and diffusion in semiconductors : bulk and layered structures : symposium held November 27-December 1, 1989, Boston, Massachusetts, U.S.A..  pp.951-954,  1990.  Pittsburgh, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 163
2.

国際会議録
国際会議録
2. Detection of SOI Fatal Defects by Cu Decoration in Conjunction with HF Immersion
Notsu, K. ; Honma, N. ; Yonehara, T.
出版情報: Silicon-on-Insulator Technology and Devices X : proceedings of the tenth International Symposium.  pp.57-62,  2001.  Pennington, N.J..  Electrochemical Society
シリーズ名: Electrochemical Society Proceedings Series
シリーズ巻号: 2001-3