1.

国際会議録
国際会議録
1. THE STUDY ON MICROSTRUCTURE BY NMR, FTIR, RAMAN CONDUCTIVITY AND OPTICAL BANDGAP IN HYDROGENATED AMORPHOUS SILICON PREPARED BY NOVEL FABRICATION METHODS
Hsu, K.C. ; Chang, H. ; Hong, C.S. ; Hwang, H.L.
出版情報: Amorphous silicon technology, 1992.  pp.69-74,  1992.  Pittsburgh, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 258
2.

国際会議録
国際会議録
2. EVIDENCE OF QUANTUM SIZE EFFECTS IN a-Si:H/a-Si1-xCx:H SUPERLATTICES
Nebel, C.E. ; Kessler, F. ; Bilger, G. ; Bauer, G.H. ; Jiang, Y.L. ; Hwang, H.L. ; Hsu, K.C. ; Hong, C.S.
出版情報: Amorphous silicon technology : symposium held April 5-8, 1988, Reno, Nevada, U.S.A..  pp.361-366,  1988.  Pittsburgh, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 118
3.

国際会議録
国際会議録
3. Opitcal fiber sensor systems for simultaneous monitoring of strain and damage in smart composites
Bang, H.J. ; Kim, D.H. ; Kang, H.K. ; Hong, C.S. ; Kim, C.G.
出版情報: Smart structures and materials 2003 : Smart sensor technology and measurement systems : 3-5 March 2003, San Diego, California, USA.  pp.43-51,  2003.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5050
4.

国際会議録
国際会議録
4. Broadcast quality 3840 × 2160 color imager operating at 30 frames/s
Iodice, R.M. ; Joyner, M. ; Hong, C.S. ; Parker, D.P.
出版情報: Sensors and camera systems for scientific, industrial, and digital photography applications IV : 21-23 January, 2003, Santa Clara, California, USA.  pp.1-9,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5017
5.

国際会議録
国際会議録
5. On-chip binary image processing with CMOS image sensors
Hong, C.S. ; Hornsey, R.I.
出版情報: Sensors and camera systems for scientific, industrial, and digital photography applications III : 21-23 January, 2002, San Jose, [California], USA.  pp.125-136,  2002.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4669