1.

国際会議録
国際会議録
1. In-situ noncontact nondestructive point-to-point microwave inspection system
Varadan,V.V. ; Hollinger,R.D. ; Tellakula,A.R. ; Jose,K.A. ; Varadan,V.K.
出版情報: Process control and sensors for manufacturing II : 3-4 March 1999, Newport Beach, California.  pp.65-72,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3589
2.

国際会議録
国際会議録
2. Automated spot-by-spot inspection of arbitrary curved dielectric structures for quality and process control
Hollinger,R.D. ; Varadan,V.V. ; Tellakula,A.R. ; Jose,K.A. ; Varadan,V.K.
出版情報: Subsurface sensing Technologies and Application II : 31 July-3 August 2000, San Diego, USA.  pp.365-372,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4129
3.

国際会議録
国際会議録
3. Wireless IDT microsensors for subsurface sensing
Varadan,V.V. ; Tellakula,A.R. ; Hollinger,R.D. ; Li,C.-T. ; Varadan,V.K.
出版情報: Subsurface sensing Technologies and Application II : 31 July-3 August 2000, San Diego, USA.  pp.352-358,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4129
4.

国際会議録
国際会議録
4. Noncontact broadband microwave material characterization at low high temperatures
Jose,K.A. ; Varadan,V.V. ; Hollinger,R.D. ; Tellakula,A.R. ; Varadan,V.K.
出版情報: Subsurface sensing Technologies and Application II : 31 July-3 August 2000, San Diego, USA.  pp.324-331,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4129
5.

国際会議録
国際会議録
5. Wireless surface-acoustic-wave-based humidity sensor
Hollinger,R.D. ; Tellakula,A.R. ; Li,C.-T. ; Varadan,V.V. ; Varadan,V.K.
出版情報: Micromachined Devices and Components V.  pp.54-62,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3876