Uzzaman, S. ; Khobaib, M. ; Hoffmann, J.P. ; Meyendorf, N.
出版情報:
Testing, Reliability, and Application of Micro- and Nano-Material Systems II. pp.230-238, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Bajjuri, S. ; Hoffmann, J.P. ; Siddoju, A.B. ; Meyendorf, N.
出版情報:
Testing, Reliability, and Application of Micro- and Nano-Material Systems II. pp.247-255, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Meyendorf, N. ; Sathish, S. ; Druffner, C.J. ; Blackshire, J.L. ; Hoffmann, J.P. ; Zhan, Q. ; Andrews, R.J.
出版情報:
Testing, Reliability, and Application of Micro- and Nano-Material Systems II. pp.256-265, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering