1.

国際会議録
国際会議録
1. RHEED STUDY OF STRAIN RELAXATION IN EPITAXIAL CdS AND Sn OVERLAYERS
Niles, David W. ; Hochst, Hartmut
出版情報: Advances in surface and thin film diffraction : symposium held November 27-29, 1990, Boston, Massachusetts, U.S.A..  pp.243-250,  1991.  Pittsburgh, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 208
2.

国際会議録
国際会議録
2. ORIENTATION DEPENDENCE OF THE STABILITY OF STRAINED Sn EPILAYERS GROWN ON Cd0.8Zn0.2Te SUBSTRATES
Niles, David W ; Hochst, Hartmut
出版情報: Long-wavelength semiconductor devices, materials, and processes : symposium held November 26-29, 1990, Boston, Massachusetts, U.S.A..  pp.439-444,  1991.  Pittsburgh, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 216
3.

国際会議録
国際会議録
3. Strong Non-linear MCD Effects Due to Partially Circular Polarized Light Sources
Hochst, Hartmut ; Zhao, Dai. ; Huber, David L.
出版情報: Magnetic ultrathin films, multilayers and surfaces--1997 : symposium held March 31-April 4, 1997, San Francisco, California, U.S.A..  pp.315-,  1997.  Pittsburgh, Pa..  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 475