1.

国際会議録
国際会議録
1. The Role of Hydrogen in the Growth of III-V Compound Semiconductors by OMVPE
Hobson,W.S.
出版情報: Hydrogen in compound semiconductors.  pp.27-60,  1994.  Zurich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 148-149
2.

国際会議録
国際会議録
2. Passivation of shallow acceptors in Si and GaAs by annealing in H2
Veloarisoa,I.A. ; Kozuch,D.M. ; Stavola,M. ; Peale,R.E. ; Watkins,G.D. ; Pearton,S.J. ; Abernathy,C.R. ; Hobson,W.S.
出版情報: Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991.  Pt.1  pp.111-118,  1992.  Zurich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 83-87
3.

国際会議録
国際会議録
3. Characterisation of GaAs/AlGaAs heterostructures grown by OMVPE using trimethylamine alane as a new alu-minum source
Hobson,W.S. ; McAfee,S.R. ; Jones,K.S. ; Paroskevopoulos,N.C. ; Abernathy,C.R. ; Sputz,S.K. ; Harris,T.D. ; Schnoes,M.Lamont ; Pearton,S.J.
出版情報: Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991.  Pt.2  pp.1063-1068,  1992.  Zurich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 83-87
4.

国際会議録
国際会議録
4. Unintentional hydrogenation of III-V semiconductors during device processing
Pearton,S.J. ; Abernathy,C.R. ; Hobson,W.S. ; Chakrabarti,U.K. ; Lopata,J. ; Kozuch,D.M. ; Stavola,M.
出版情報: Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991.  Pt.2  pp.617-622,  1992.  Zurich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 83-87
5.

国際会議録
国際会議録
5. Strain-compensated InGaAs/GaAsP/InGaP laser
Dutta,N.K. ; Hobson,W.S. ; Vakhshoori,D. ; Lopata,J. ; Zydzik,G.J.
出版情報: Fabrication, testing, and reliability of semiconductor lasers II : 13-14 February, 1997, San Jose, California.  pp.22-33,  1997.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3004