1.

国際会議録
国際会議録
1. Measurement of surface figure and optical thickness variation of a thin parallel plate in wavelength-scanned interferometry with minimized laser tuning range
Hibino, K. ; Burke, J. ; Oreb, B.F.
出版情報: Optical manufacturing and testing V : 3-5 August 2003, San Diego, California, USA.  pp.421-428,  2003.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5180
2.

国際会議録
国際会議録
2. Wavefront sensing of a rear-surface reflection through a transparent media suppressing multiple-beam interference effect
Hibino, K. ; Takatsuji, T. ; Osawa, S. ; Kurosawa, T.
出版情報: Advanced photonic sensors and applications II : 27-30 November 2001, Singapore.  pp.150-157,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4596
3.

テクニカルペーパー
テクニカルペーパー
3. Direct Evidence of the Interplanetary Magnetic Field Effect on the Cosmic-Ray Shadow by the Sun
Amenomori, M. ; Cao, Z. ; Ding, L.K. ; Feng, Z.Y. ; Hibino, K. ; Hotta, N. ; Huang, Q. ; Huo, A.X. ; Jia, L.K. ; Jiang, G.Z. ; Jiao, S.Q. ; Kajino, F. ; Kasahara, K. ; Labaciren ; Mei, D.M. ; Meng, L. ; Meng, X.R. ; Mimaciren ; Mizutani, K. ; Mu, J. ; Nanjo, H. ; Nishizawa, M. ; Nusang ; Oguro, A. ; Ohnishi, M. ; Ohta, I. ; Ouchi, T. ; Ren, J.R. ; Saito, To. ; Sakata, M. ; Shi, Z.Z. ; Shibata, M. ; Shirai, T. ; Sugimoto, H. ; Sun, X.X. ; Tai, A. ; Taira, K. ; Tan, Y.H. ; Tateyama, N. ; Torii, S. ; Wang, H. ; Wen, C.Z. ; Yamamoto, Y. ; Yao, X.Y. ; Yu, G.C. ; Yuan, P. ; Yuda, T. ; Zeng, J.G. ; Zhang, C.S. ; Zhang, H.M. ; Zhang, L. ; Zhasang ; Zhaxiciren ; Zhou, W.D.
出版情報: NASA Technical Reports.  pp.1-19,  1993.  National Aeronautics and Space Adminstration
4.

国際会議録
国際会議録
4. Absolute interferometry for surface shapes with large steps by wavelength tuning with a mechanical phase shift [6292-27]
Hibino, K. ; Tani, Y. ; Takatsuji, T. ; Bitou, Y. ; Warisawa, S. ; Mitsuishi, M.
出版情報: Interferometry XIII: Techniques and Analysis.  pp.62920Q-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 6292
5.

国際会議録
国際会議録
5. Improved algorithms for wavelength scanning interferometry: application to the simultaneous measurement of surface topography and optical thickness variation in a transparent parallel plate
Hibino, K. ; Oreb, B.F. ; Fairman, P.S.
出版情報: Interferometry XI: Techniques and Analysis.  pp.212-219,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4777
6.

国際会議録
国際会議録
6. Interferometric measurement of a multiparallel-surface transparent object by a new class of wavelength tuning algorithms
Hibino, K. ; Burke, J. ; Hanayama, R. ; Oreb, B.F.
出版情報: Interferometry XII: Techniques and Analysis.  pp.76-84,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5531
7.

国際会議録
国際会議録
7. Refractive index inhomogeneity measurement of a parallel plate in a Fizeau intrferometer by a new wavelength scanning algorithm
Hibino, K. ; Oreb, B.F. ; Fairman, P.S.
出版情報: 19th Congress of the International Commission for Optics: Optics for the Quality of Life.  pp.876-877,  2003.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4829