Bendjus, B. ; Kohler, B. ; Heuer, H. ; Rabe, U. ; Striegler, A.
出版情報:
Testing, Reliability, and Application of Micro- and Nano-Material Systems IV. pp.617509-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering