1.

国際会議録
国際会議録
1. Analysis of a chemical method to increase extreme-ultraviolet mictochannel-plate quantum efficiency
Hemphill, R. ; Edelstein, J.
出版情報: Future EUV/UV and visible space astrophysics missions and instrumentation : 22-23 August 2002, Waikoloa, Hawaii, USA.  pp.577-582,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4854
2.

国際会議録
国際会議録
2. Status of the Cosmic Hot Intgerstellar Plasma Spectrometer(CHIPS) university-class explorer mission
Hurwitz, M. ; Davis, R. ; Dawson, S. ; Dobson, P. ; Donakowski, W. ; Friedman, A. ; Gaines, G.A. ; Edelstein, J. ; Hemphill, R. ; Hoberman, J. ; Janicik, J. ; Jelinsky, P.N. ; Lampton, M.L. ; Marchant, W. ; Marckwordt, M. ; Mirczak, J. ; Sasseen, T.P. ; Sholl, M. ; Siegmund, O.H.W. ; Sirk, M.M. ; Stone, D. ; Sulack, S. ; Riddle Taylor, E. ; Veno, M. ; Wolff, J.
出版情報: Future EUV/UV and visible space astrophysics missions and instrumentation : 22-23 August 2002, Waikoloa, Hawaii, USA.  pp.319-328,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4854
3.

国際会議録
国際会議録
3. EUV detector of the Cosmic Hot Interstellar Plasma Spectrometer
Marckwordt, M.R. ; Gaines, G.A. ; Edelstein, J. ; Hemphill, R. ; Hull, J.S. ; Hurwitz, M. ; Lampton, M.L. ; McKee, K. ; Sasseen, T.P. ; Sholl, M. ; Siegmund, O.H.W. ; Sirk, M.M. ; Taylor, E.R.
出版情報: UV/EUV and visible space instrumentation for astronomy II : 7 August 2003, San Diego, California, USA.  pp.43-53,  2003.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5164
4.

国際会議録
国際会議録
4. Performance of the Cosmic Hot Interstellar Plasma Spectrometer
Sirk, M.M. ; Gaines, G.A. ; Taylor, E.R. ; Sholl, M. ; Marchant, W. ; Hemphill, R. ; Kimble, R.A. ; Sasseen, T. ; Marckwordt, M.R. ; Donakowski, W.
出版情報: UV/EUV and visible space instrumentation for astronomy II : 7 August 2003, San Diego, California, USA.  pp.54-62,  2003.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5164
5.

国際会議録
国際会議録
5. MATERIAL CHARACTERIZATION BY CONTACTLESS PHOTO-CONDUCTIVITY MEASUREMENTS
Johnson, S.M. ; Johnson, L.G. ; Hemphill, R.
出版情報: Materials characterization : symposium held April 15-17, 1986, Palo Alto California, U.S.A..  pp.367-372,  1986.  Pittsburgh, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 69