Microfluidics and bioMEMS : 22-24 October 2001, San Francisco, USA. pp.126-132, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
In-plane semiconductor lasers IV : 24-25 January 2000, San Jose, California. pp.21-31, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Electronic imaging and multimedia systems II : 18-19 September, 1998, Beijing, China. pp.311-314, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Third International Conference on Thin Film Physics and Applications : 15-17 April 1997, Shanghai, China. pp.188-191, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Third International Conference on Thin Film Physics and Applications : 15-17 April 1997, Shanghai, China. pp.90-93, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Biomedical photonics and optoelectronic imaging : 8-10 November 2000, Beijing, China. pp.114-117, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Biomedical photonics and optoelectronic imaging : 8-10 November 2000, Beijing, China. pp.109-113, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Detectors, focal plane arrays, and applications : 4-5 November 1996, Beijing, China. pp.224-229, 1996. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Optical measurement and nondestructive testing : Techniques and applications, 8-10 November 2000, Beijing, China. pp.370-374, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering