1.

国際会議録
国際会議録
1. Using the Ratio of Loading Slope and Elastic Stiffness to Predict Pile-Up and Constraint Factor During Indentation
Hay, J. L. ; Oliver, W. C. ; Bolshakov, A. ; Pharr, G. M.
出版情報: Fundamentals of nanoindentation and nanotribology : symposium held April 13-17, 1998, San Francisco, California, U.S.A..  pp.101-,  1998.  Warrendale, Penn..  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 522
2.

国際会議録
国際会議録
2. Mechanical Characterization of Ultrathin, Hard-Disk Overcoats Using Scratch Testing and Depth-Sensing Indentation
Hay, J. L. ; White, R. L. ; Lucas, B. N. ; Oliver, W. C.
出版情報: Thin-films : stresses and mechanical properties VII : symposium held December 1-5, 1997, Boston, Massachusetts, U.S.A..  pp.325-,  1998.  Warrendale, Pa..  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 505
3.

国際会議録
国際会議録
3. The Importance of Contact Radius for Substrate-Independent Property Measurement of Thin Films
Hay, J. L. ; O'Hern, M. E. ; Oliver, W. C.
出版情報: Fundamentals of nanoindentation and nanotribology : symposium held April 13-17, 1998, San Francisco, California, U.S.A..  pp.27-,  1998.  Warrendale, Penn..  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 522
4.

国際会議録
国際会議録
4. Nanoindentation Characterization of Coated Systems: P:S2-A New Approach Using the Continuous Stiffness Technique
Page, T. F. ; Pharr, G. M. ; Hay, J. L. ; Oliver, W. C. ; Lucas, B. N. ; Herbert, E. ; Riester, L.
出版情報: Fundamentals of nanoindentation and nanotribology : symposium held April 13-17, 1998, San Francisco, California, U.S.A..  pp.53-,  1998.  Warrendale, Penn..  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 522