1.

国際会議録
国際会議録
1. Residual Stress Measurement in Sputtered Copper Thin Films by Synchrotron Radiation and Ordinary X-Rays
Hataya, M. ; Hanabusa, T. ; Kusaka, K. ; Tominaga, K. ; Matsue, T. ; Sakata, O.
出版情報: Residual stresses VII : ICRS 7 : proceedings of the 7th International Conference on Residual Stresses, ICRS-7 Xi'an, China, 14-17, June, 2004.  pp.661-666,  2005.  Uetikon-Zuerich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 490-491
2.

国際会議録
国際会議録
2. Development of New Stress Measurement Method Using Neutron Diffraction
Suznki, H. ; Minakawa, N. ; Moriai, A. ; Hataya, M. ; Morii, Y.
出版情報: Residual stresses VII : ICRS 7 : proceedings of the 7th International Conference on Residual Stresses, ICRS-7 Xi'an, China, 14-17, June, 2004.  pp.245-250,  2005.  Uetikon-Zuerich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 490-491